An Avalanche Photodiode (APD) is a photodetector that provides a built-in first stage of gain via avalanche multiplication. Provision of this internal signal gain is what differentiates an APD from a PIN photodiode.
An APD provides higher sensitivity and so is ideal for extreme low-level light detection and photon counting. Available as Silicon or InGaAs photodiodes, these devices detect in the 400nm – 1100nm range. Multiple configurations are available to provide a wide range of sensitivity and speed options.
The use of avalanche photodiodes instead of PIN photodetectors will result in improved sensitivity – useful in applications where the noise of the amplifier is high i.e. much higher than the noise in the photodetector.
New C30733 Series Avalanche Photodiodes – High Speed, High Gain
New from Excelitas is the C30733 Series of high speed, high gain, low noise lnGaAs APDs. The C30733 provides high quantum efficiency (QE), high responsivity, low noise and fast recovery in the spectral range between 1000 nm and 1700 nm.
This unique combination of high gain and fast recovery time, coupled with low noise performance, makes it an ideal solution for high-end test equipment where extremely fast response and recovery time is required. Its ability to operate at very high gain with low noise performance fundamentally improves the signal to noise ratio and enables the detection of very low signals and small changes in fiber integrity for testing over long fiber telecom networks with high precision.
Contact us for more details or view our APD products here.